HS · CN · 90314970
EU · CN

90314970

For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices

HS-6 9031.49
Taxes and fees —
Unit No.
Year of release 2026

Same HS-6 in other countries

AE · 903149 AR · 903149 AU · 90314900 AU · 903149 BR · 903149 BR · 903149 CA · 903149 CA · 90314910 CL · 903149 CN · 903149 CO · 903149 E2 · 9031491000 EG · 903149 GB · 903149 GB · 9031490000 ID · 903149 IN · 903149 JP · 903149000 JP · 903149 KR · 903149 MY · 903149 NZ · 9031490010 NZ · 903149 PH · 903149 SA · 903149 SG · 903149 SG · 90314900 TH · 903149 TR · 90.31.49.10.00.00 TR · 903149 US · 903149 US · 9031.49.10.00 VN · 903149 ZA · 903149 MX ·

This information is for guidance only. Tariff codes and measures may vary depending on the effective date, product characteristics, origin and assessment by the relevant customs authority. Please check with an official source or expert before making a final declaration.