HS · CN · 90314970
EU · CN

90314970

For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices

For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices

HS-6 9031.49
Duty —
Unit No.
Year 2026

Same HS-6 in other countries

AE · 903149 AR · 903149 AU · 90314900 AU · 903149 BR · 903149 BR · 903149 CA · 903149 CA · 90314910 CL · 903149 CN · 903149 CO · 903149 E2 · 9031491000 EG · 903149 GB · 903149 GB · 9031490000 ID · 903149 IN · 903149 JP · 903149000 JP · 903149 KR · 903149 MY · 903149 NZ · 9031490010 NZ · 903149 PH · 903149 SA · 903149 SG · 903149 SG · 90314900 TH · 903149 TR · 90.31.49.10.00.00 TR · 903149 US · 903149 US · 9031.49.10.00 VN · 903149 ZA · 903149 MX ·

This information is provided for guidance only. Tariff codes and measures may change by effective date, product characteristics, origin and the assessment of the relevant customs authority. Verify with the official source or a qualified expert before final clearance.