HS · CN · 90314100
EU · CN

90314100

For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)

For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)

HS-6 9031.41
Duty —
Unit —
Year 2026

Same HS-6 in other countries

AE · 903141 AR · 903141 AU · 90314100 AU · 903141 BR · 903141 BR · 9031.41.00 CA · 903141 CA · 90314100 CL · 903141 CN · 903141 CO · 903141 E2 · 9031410000 EG · 903141 GB · 903141 GB · 9031410000 ID · 903141 IN · 903141 JP · 903141000 JP · 903141 KR · 903141 MY · 903141 NZ · 9031410000 NZ · 903141 PH · 903141 SA · 903141 SG · 903141 SG · 90314100 TH · 903141 TR · 90.31.41.00.00.00 TR · 903141 US · 903141 US · 9031.41.00 VN · 903141 ZA · 903141 MX ·

This information is provided for guidance only. Tariff codes and measures may change by effective date, product characteristics, origin and the assessment of the relevant customs authority. Verify with the official source or a qualified expert before final clearance.